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3:50
YouTube
Tessent Silicon Lifecycle Solutions
Tessent BoundaryScan - Use of Boundary Scan chain during ATPG
Boundary scan chain used for 1149.1 or 1149.6 interconnect tests is typical. This video shows usage of boundary scan as compressed or uncompressed chain during ATPG so all the pins of the device under test (DUT) do not need to be contacted. To learn more about Tessent BoundaryScan, visit: https://eda.sw.siemens.com/en-US/ic/tessent/test ...
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