Cardiovascular disease remains a leading global cause of death, and we break down its pathology, risk factors, and the ...

Red light range: Pay attention to the wavelengthsred light typically falls between 630660 nanometers, while near-infrared is usually around 830 nanometers, says Dr. Henry. Look for masks that fall ...

Two years after a panel flew off a 737 Max, Boeing is doing more inspections, completing work in its intended order and making other changes. Can the company keep it up? The number of 737 Max planes ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Researchers have created an innovative method to visualize and analyze atomic structures within specially designed, ultrathin bilayer 2D materials. (Nanowerk News) Researchers with the Oak Ridge ...

On the left is an artistic depiction of a twisted double layer forming a moiré pattern created by overlapping 2D sheets; each layer’s structure is shown separately on the right. Researchers with the ...

One in 33 babies in the United States are born with birth defects. But a new study from the Centers for Disease Control and Prevention is raising awareness of ways to lower that risk. The study points ...

Forbes contributors publish independent expert analyses and insights. Joan Vos MacDonald is a New York-based writer who covers Korean media. The children were part of a horrifying scheme in which a ...

Understanding how dislocations (line defects in the crystal structure) occur when 3D-printing metals has been unclear to materials scientists. Understanding when and how dislocations form in ...

For James Antaki, a biomedical engineering professor at Cornell University, the $6.7 million government grant meant babies would be saved. Awarded by the Department of Defense on March 30, it would ...

If your hard drive is full, and you're not sure what could possibly be taking up all that space, you might think your only option is to tediously go through your file lists, one by one. Thankfully ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...