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Value Stream Map vs. Process Map: What’s the Difference?

Value stream map vs. process map, which is better for you? As with many tools and methods in Six Sigma, there isn’t a one-size-fits-all approach to mapping things out. Both of these tools have ...
Electronic Design

In an Uncertain World, Adaptable Process Control is the Smart Move

How self-tuning can support an adaptive control strategy. How Model Reference Adaptive Control can improve adaptability. The different types of MRAC. A certain amount of flexibility is always good to ...
ISA

Author Q&A: Nonlinear Model-Based Control - Using First-Principles Models in Process Control

Author Dr. R. Russell Rhinehart discusses his new book, Nonlinear Model-Based Control: Using First-Principles Models in Process Control, and explains why nonlinear first-principles models should be ...
Semiconductor Engineering

Tackling Variability With AI-based Process Control

Jon Herlocker, co-founder and CEO of Tignis, sat down with Semiconductor Engineering to talk about how AI in advanced process control reduces equipment variability and corrects for process drift. What ...
Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
News Medical

Real-time process control in nanodispersion manufacturing via continuous nanoparticle size monitoring

Aim: To demonstrate the potential of in-line nanoparticle size measurements using the NanoFlowSizer (NFS) as a PAT method. To achieve real-time process control by establishing automated regulation of ...