When you purchase through links on our site, we may earn an affiliate commission. Here’s how it works. The Sarnoff Digital Test Pattern When I was approached about evaluating the Sarnoff Digital Test ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...

This page provides information regarding a spatial point pattern test I developed as part of my PhD Dissertation. This is a point pattern test that measures the degree of similarity at the local level ...