Watch Full Movie on Digital or Stream on Demand starting February 19th, 2021 ...

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...

The West Bengal College Service Commission has announced the WB SET exam pattern in the official notification PDF. You should check the pattern to get an idea of the actual exam requirements. It helps ...

RRB NTPC Exam Pattern 2024: The Railway Recruitment Board (RRB) has released the notification for the recruitment of non-technical popular categories. To successfully pass the Railway NTPC 2024 ...

SSC CHSL Exam Pattern 2025: The Staff Selection Commission (SSC) releases SSC CHSL Exam Pattern along with the official notification. Knowing the paper pattern is important for effective preparation.

This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

The College Board released its 2016 SAT college-entrance test results today, see report here from the Washington Post “SAT scores fall modestly in a year of transition for college admission test.” As ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test ...