This close examination of S20.20 reveals the key ingredients to a successful ESD control program. Multinational manufacturing corporations are racing to pursue the cost benefits of economic geography.

This file type includes high resolution graphics and schematics when applicable. EOS and ESD may be caused by the user’s application due to a transient, excessive supply current, poor grounding, low ...

This ESD model is one of the first used and attempts to model a human that has accumulated static charge and dissipates it onto the device under test. The setup for this test is a 100pF capacitor is ...

The state-of-the-art in robustness design and analysis for ESD (electrostatic discharge) always lags our ability to characterize and qualify a device or system. The ESD Association, IEC, JEDEC, and ...

•ESD protectors with low dynamic resistance won’t necessarily protect circuits. •Most damage is caused within the first nanosecond of an ESD event. •The ESD protector should set as close as possible ...