A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...

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Learners who wish to receive a certificate must register for the exam scheduled on April 17, 2026, which will be conducted in two sessions - 9:30 am to 12:30 pm and 2 pm to 5 pm ...