As designs transition from 130nm to 90nm and below, designers must consider manufacturing effects early in the design cycle. Shrinking design nodes, larger designs, and expanding design complexity ...
Process variations can transform the most innovative integrated circuit design into a failure. To account for these variations, designing for high manufacturing yield is as important as designing for ...
Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...
Detection and monitoring of the yield loss mechanisms and defects in product chips have been a subject of extensive efforts, resulting in multiple useful Design-for-Manufacturing (DFM) and ...
September 25, 2012. ProPlus Design Solutions Inc., a provider of design for yield (DFY) solutions that integrate device modeling, parallel SPICE simulation, and statistical analysis, today unveiled ...
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