Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Plastic deformation in metals and alloys is governed by the generation and evolution of defects of point, line, plane and volume types 1,2. Among these defects, stacking fault tetrahedra (SFT), ...

Lead halide perovskites can be turned into optoelectronic devices through low-cost solution depositions, but these approaches often leave numerous charge-trapping defects in the perovskite.