Foundries and packaging houses are wrestling how to control heat in the testing phase, particularly as devices continue to shrink and as thermally sensitive analog circuits are added into SoCs and ...

Plaintiff SEMICAPS filed suit in the Northern District of California, alleging infringement of U.S. Patent No. 7,623,982, which relates to the testing of electronic circuits using a laser. The ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Testing verifies that protection schemes meet their intended purpose, ensuring safety and system integrity. Function testing involves manual or electrical manipulation of components to confirm signal ...

(Nanowerk News) Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to fracture—of the thin insulating films that ...

All electronic circuits and equipment receive input signals and process them into new and different output signals. When you’re designing and testing circuits and equipment, where do you get those ...

When testing circuits with a logic probe, it is sometimes difficult to watch the LEDS on the probe to determine the logic state. With this probe the logic states are audible. This probe is designed ...