STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

A selection of probes, from [Jim Williams’] Linear Technology app note 72. It’s not often that we are shown an entirely new class of test equipment here at Hackaday, so it was with some surprise that ...