Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...
Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...
Testing of battery cells is frequently performed on fairly large groups of cells at the same time. Before testing can begin, the cells must be properly connected to the test equipment. For cells in a ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
Expands automotive Ethernet software portfolio to address automotive Ethernet multi-gigabit receiver tests Delivers complete validation solution for MultiGBASE-T1 receiver design and characterization ...
I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...
The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...
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