Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

Operating at millimetRE-wave frequencies introduces a set of engineering challenges that extend far beyond traditional radio frequency testing ...

New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...

Ensuring the quality of silicon and organic interposers is becoming harder as the number of signals passing through them continues to grow, fueled by more chiplets, higher processing demands, and more ...

Funding led by Scale Venture Partners will accelerate native mobile testing and AI enhancements. Two-thirds of enterprise software companies test less than 50% of their workflows before releasing new ...

Just like production code, test code needs to be rigorously examined to ensure it’s clean and bug free. In this first half of a two-part article, Klaus Berg makes the case for why good unit tests are ...

Choosing the right test management tool directly impacts your team's ability to ship quality software fast. QA teams today juggle manual tests, automated suites, scattered documentation, and ...

TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its 7038 Single Test Rack (STR) system-level test (SLT) and ...