Fort Worth, TX. ITC is underway this week, with companies on hand to highlight their software, switching systems, mmWave test cells, test structures, sensors, and power supplies. For example, ...
About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...
testXpert ® is the universal Zwick test software for materials, component, and functional testing. Its application range goes from Zwick materials testing machines (for tensile, compression, flexure ...
Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing ...
Today’s industry trends are prompting semiconductor manufacturers to adopt embedded solutions to compress test time and data volume. Semiconductor companies on the leading edge of the nanometer ...
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