San Jose, Calif. — Magma Design Automation Inc. has launched the Talus automatic test pattern generation (ATPG) and Talus ATPG-X products with on-chip compression. These advanced ATPG products are ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Fort Worth, TX. ITC is underway this week, with companies on hand to highlight their software, switching systems, mmWave test cells, test structures, sensors, and power supplies. For example, ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Applications like as smart cards and devices used in the defense industry require security to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement met ...

Compressing digital panoramic images can affect their diagnostic quality and the ability to evaluate certain anatomical structures, according to a study in Clinical Oral Investigations (July 6, 2011).

Corrugated cardboard is used all over the world for strong, cheap, and light recyclable packaging. Many boxes are made to certain customers’ demands, and the aim of these tests is to maximize strength ...