About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Fort Worth, TX. ITC is underway this week, with companies on hand to highlight their software, switching systems, mmWave test cells, test structures, sensors, and power supplies. For example, ...

Timely delivery of highly reliable semiconductor products to market is essential to success in today’s competitive business environment. As if following through on this objective were not already ...

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...

Mission-critical applications within markets such as transportation and medical devices require higher overall manufacturing test quality, but that often means more test patterns, data volume, and ...

Corrugated cardboard is used all over the world for strong, cheap, and light recyclable packaging. Many boxes are made to certain customers’ demands, and the aim of these tests is to maximize strength ...

Until the early 1970s, there was relatively little interest in measuring the compressive properties of composite materials. For design purposes, it was generally assumed that the compressive strength ...