November 3, 2013. FEI has released ExSolve, an automated, high throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep (WTP) dramatically ...
HILLSBORO, Ore. , April 20, 2021 /PRNewswire/ -- Thermo Fisher Scientific, the world leader in serving science, today unveiled the Helios 5 EXL Wafer DualBeam, designed to meet increasing sample ...
When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...
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In this process, the particle to be studied is exposed to electron beams under a high-resolution microscope called a transmission electron microscope and the micrographs or images captured are ...
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