AZoNano

SEM, AFM, Correlative Microscopy and Heterostructure Analysis

The majority of semiconductor devices are made up of heterostructures, which are stacked layers of distinctive materials deposited by utilizing distinctive methods. These layers have a thickness in ...
AZoNano

Nanoparticle Analysis - Correlating EDX, AFM and SEM Data

Nanoparticles find their use in numerous everyday commercial products, including cosmetics, foods and pharmaceuticals. Their characterization at the nanometer scale requires very particular ...
AZOM

Simultaneous AFM and SEM with AFSEM®

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...
EurekAlert!

SEM, AFM and TEM Characterizations of Catalysts (IMAGE)

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert ...
AZOM

Correlative Microscopy and SEM-AFM

Almost all semiconductor devices are formed of heterostructures, which are stacked layers of distinctive materials deposited using distinctive techniques. These layers have a thickness in the range of ...