Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

This webinar will cover three widely used high-resolution microscopy techniques that deliver nanoscale insights: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground states using a new form of scanning probe microscopy. In the last few years ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

Lithium ion batteries dominate the energy storage sector from the scale of small portable devices to electric vehicles and even grid-scale electricity suppliers. Research is constantly ongoing to ...

The work was supported by the World Premier International Research Center Initiative (WPI), MEXT, Japan, JSPS Grants-in-Aid for Scientific Research (21H01770, 22K04890). The principle of scanning ion ...