A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground states using a new form of scanning probe microscopy. In the last few years ...

What is Magnetic Force Microscopy (MFM)? Magnetic Force Microscopy (MFM) is a scanning probe microscopy technique that allows the imaging and characterization of magnetic properties of materials at ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

Kelvin probe force microscopy (KPFM) is a key electrical mode used in scanning probe microscopy. It measures a fundamental physical property of materials – a surface potential. Compared to other modes ...