As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
SAN MATEO, Calif. — Design-for-test tool vendor SynTest Technologies Inc. is putting the finishing touches on a test-data volume compaction technology for scan-based design. VirtualScan will help ...
Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...
Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...
At Alcatel-Lucent, we test chassis-level products that provide 42 board slots on a midplane, essentially a passive backplane that accepts boards on its front and rear sides. Thirty-four of those slots ...
Bigger designs with hundred of cores are creating an explosion in the volume of scan test data, significantly bumping up the amount of time spent on test. That raises the cost of test, forcing ...
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