As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...
SAN MATEO, Calif. — Design-for-test tool vendor SynTest Technologies Inc. is putting the finishing touches on a test-data volume compaction technology for scan-based design. VirtualScan will help ...
Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...
If there's a truism in design debug and test, it's that the earlier you can find a bug, the less costly it is to fix. Thus, finding bugs at RTL is far preferable to finding them after synthesis. With ...
Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...
I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...