Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...

Today, PCBs are becoming more and more complex, and that means adequate test coverage is becoming harder and harder to achieve. Moreover, every test methodology has its limitations. As a result, many ...

It should come as no surprise that Moore's Law of regularly doubling chip capacity is having an impact on automatic test equipment (ATE) for ICs. ATE, of course, applies patterns of signals and checks ...