For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...