A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.
Amit Sanghani, Vice President of Engineering, HW-Analytics and Test Group at Synopsys, discusses how Silicon Lifecycle Management (SLM) is changing the way we look at the complete device lifecycle ...
The long lead time for the development of blades and vanes used in gas turbines, such as in power stations, presents a significant challenge to the validation of new part designs in engine tests.
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