Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

Oscilloscopes remain a hot topic on the RF DesignLine, so I had a virtual “sit down” with some leaders in the industry to see where the technology is, and where they think it is going. The following ...

RF testing for devices such as amplifiers and RFICs can be tedious work. Such devices work over a wide range of frequencies and power levels, and they must meet specifications over temperature and ...

Modern radio frequency (RF) components introduce many challenges to outsourced semiconductor assembly and test (OSAT) suppliers whose objective is to ensure products are assembled and tested to meet ...

A tough challenge for test engineers is explored in terms of test methods, pitfalls, and measurement errors. For the test engineer, RF and microwave power amplifier testing imposes unique challenges.

Scalable Card Offers Future-Proof 100MHz–20GHz Bandwidth for All RF Applications, Solves Test Challenges for Wide-Bandwidth Applications, Including Wi-Fi 7 and UWB TOKYO, Nov. 18, 2024 (GLOBE NEWSWIRE ...