Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...
The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Available with up to 48 pins and eight source-measurement units, the next-generation 4080 Series parametric test platform from Agilent Technologies features resolution to 1 femtoamp and 0.1 microvolt.
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