Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...

Jeff Johnson, mechatronics product manager, Beckhoff Automation Quality assurance bottlenecks are especially apparent when working with different components and in high-mix low-volume production. This ...

Rochester Institute of Technology recently installed a MIRTEC MV3 OMNI automated, optical inspection machine in its Center for Electronics Manufacturing and Assembly (CEMA). The equipment enables ...

Applied Materials has launched a new generation of optical semiconductor wafer inspection machines that incorporate big data and AI techniques. These multimillion-dollar machines are used in chip ...

As semiconductor devices continue advancing into more sophisticated packaging schemes, traditional optical inspection technologies are brushing up against physical and computational boundaries. The ...

Building good automated models for inspection require more data to be collected, both good and bad. Vijay Thangamariappan, R&D engineer at Advantest, explains how to develop models for automating ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

The small vision system is located only about 2 inches above the incoming boards’ surface. The 2D camera can identify up to 45 reads per second from this continuous conveyor line. High-volume ...