Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...
The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback