EDN

Cadence Modus Test Solution Enables Support for Safety-Critical SoC Designs Using ARM MBIST Interface

Through Cadence's support of the ARM MBIST interface, customers can deliver innovative SoC designs to market faster and with better power, performance and area (PPA). For example, the Modus Test ...
Design-Reuse

New Cadence Modus Test Solution Delivers Up to 3X Reduction in SoC Test Time

Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced the new Modus™ Test Solution that enables design engineers to achieve an up to 3X reduction in test time, thereby reducing production test ...
Electronic Design

Automotive semiconductor test key topic at ITC

When the 2016 International Test Conference convened in November in Fort Worth, TX, automotive semiconductor test was the key topic, with a special technical session on the subject including ...
Design-Reuse

Cadence Modus Test Solution Enables Support for Safety-Critical SoC Designs Using Arm MBIST Interface

SAN JOSE, Calif., Nov. 14, 2016 – Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that the Cadence ® Modus ™ Test Solution now supports the Arm ® Memory Built-In Self Test (MBIST) ...