Through Cadence's support of the ARM MBIST interface, customers can deliver innovative SoC designs to market faster and with better power, performance and area (PPA). For example, the Modus Test ...
Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced the new Modus™ Test Solution that enables design engineers to achieve an up to 3X reduction in test time, thereby reducing production test ...
When the 2016 International Test Conference convened in November in Fort Worth, TX, automotive semiconductor test was the key topic, with a special technical session on the subject including ...
In any production environment, testing components quickly and accurately is a dual challenge. A solution from Modus Test addresses this by combining an MPT tester with an MTC cycler —a setup that ...
Modus Test has signed an agreement with Wells-CTI to becomethe exclusive supplier of interface boards and universal manual actuators forthe Wells-CTI CR-2601 automated contact-resistance socket tester ...
Advanced AI/CPU processors demand extreme high frequency and power performance from SLT and ATE test sockets. These sockets are in the critical path at the end of a very costly silicon fabrication and ...
Fort Worth, TX. ITC is underway this week, with companies on hand to highlight their software, switching systems, mmWave test cells, test structures, sensors, and power supplies. For example, ...
SAN JOSE, Calif., Nov. 14, 2016 – Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that the Cadence ® Modus ™ Test Solution now supports the Arm ® Memory Built-In Self Test (MBIST) ...
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