Leuven, Belgium. Imec and Cascade Microtech, a FormFactor company, have announced the successful development of a fully automatic system for pre-bond testing of advanced 3D chips. Pre-bond testing is ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

Micro probes are generally used to check and test small pitch, high-density electronic devices, such as chips, wafers, or ball-grid arrays. Most conventional probes use long, thin cantilever springs ...

HSINCHU, March 18, 2025 /PRNewswire/ -- STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of probe card ...

STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...

It took scientists just 0.9 megapascals of pressure to pierce a problem holding back the next wave of display technology. At Tianjin University, researchers have unveiled a groundbreaking method to ...

Change in life is inevitable. You know this, yet sometimes you just choose not to accept it. You just close your eyes and think the world has also stopped. But even you realize that’s not the case. It ...

The new product maintains the high performance proven with the current Micro Prober “MR502″/”MR612” model while reducing the test takt time, cutting the foot ...

Micro-impact testing is a new repetitive contact technique, developed by Micro Materials, that is becoming more widespread as companies seek to optimise coating adhesion, toughness and resistance to ...

MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro-cantilever ...