For decades, optical inspection has been the primary method for process control in fabs. However, the move to multi-level interconnects and 3D transistor designs means that many killer defects are no ...
Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...
Applied Materials has launched a new generation of optical semiconductor wafer inspection machines that incorporate big data and AI techniques. These multimillion-dollar machines are used in chip ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results