EDN

Designing with a complete simulation test bench for op amps, Part 3: Input-referred errors

Previous installments of this series discussed the need to verify SPICE model accuracy and how to measure the output impedance and small-signal bandwidth of operational amplifier (op amp) models. In ...
Electronic Design

Very-Low-Input-Bias-Current Op Amp Has Plenty of Written Support for Design Engineers

In a simplified schematic from its datasheet, Linear Technology's LTC6268 (and 6269 dual) provide no evidence of "secret sauce." Rather, it shows a combination of semiconductor design and process ...
Electronic Design

Measuring Input Current of a Buck or Flyback Converter

For the PDF version of this article, click here. When designing converters, it is often desirable to measure the dc current coming into the converter. This is particularly true when batteries are ...
EDN

Test Op Amps Via Simple Input Offset Voltage Measurement

Measuring this one vital parameter (Input Offset Voltage) provides a simple means of determining if the DUT (Device Under Test) is either good or bad. The circuit is very simple, requiring only four ...
Semiconductor Engineering

Test Data Streaming For The Next Generation Of Designs

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...