The Jandel CYL-RM3000 Four Point Probe System is used to measure the sheet resistance of shallow layers (as a result of epitaxy, ion-implant, diffusion or sputtering) and the bulk resistivity of bulk ...

The majority of metal traces used to produce electrical connections in semiconductor devices begin life as blanket metal films that are later patterned and etched to create conductive connections ...

Sheet resistance monitoring is essential for ion implant doping and anneal characterization. It’s also commonly used in processes such as ion implantation, metal deposition, diffusion, and epitaxial ...

Semiconductor material research and device testing often involve determining the resistivity and Hall mobility of a sample. The resistivity is often determined using a four-point probe or Kelvin ...