LIVERMORE, Calif. (KGO) -- In the next 30 years, scientists say there's a 1 in 3 chance of a major earthquake on the Hayward Fault, impacting millions across the East Bay. Now, we're getting a clearer ...

Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...

The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

“Enhancing the reliability of the system is important for recent system-on-chip (SoC) designs. This importance has led to studies on fault diagnosis and tolerance. Fault-injection (FI) techniques are ...

Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...

ROSEVILLE, MN, January 30, 2015 – WinterLogic, Inc., the industry leader in fault simulation, today announced release of Z01X 2.9 with integration into YOGITECH Functional Safety Verification flow, ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...

A simulation released by the Washington State Department of Natural Resources (DNR) shows the impact of a 7.5-magnitude earthquake on the Seattle Fault. “Tsunami waves could be as high as 42 feet at ...