For the uninitiated, low-density parity-check (LDPC) code is an error correction code (ECC) that is used to both detect and correct errors on data that is transmitted ...
Furthermore, error-prevention mechanisms such as Wear Leveling (WL), Read Disturb Management (RDM), Near-Miss ECC, and Dynamic Data-Refresh (DDR) work together to manage the efficient and reliable ...
Micron Technology introduced a line of NAND flash memory products today that it says will lengthen the lifespan of solid-state storage by integrating error management ...
San Jose, California – September 30, 2011 -Arasan Chip Systems, Inc.(“Arasan†), a leading provider of Total IP Solutions, announced today that the company added an ONFI 3.0 PHY to its Flash ...
Boston, MA -- March 2, 2010 - iSine Inc. (www.isine.com) has announced the full release of its Extreme ECC technology that meets the needs of the most demanding error ...
Interest in triple-level cell (TLC) NAND flash is growing and the high density flash memory technology could have cost benefits over single-level NAND in SSDs, but only if endurance and retention ...
Toshiba's BENAND removes the burden of ECC from the host processor while minimizing protocol changes and allowing host processors to support leading-edge process NAND flash memory in a timely manner.
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