Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Reliability is expected when systems are new. The real test comes after deployment and years of continuous operation.

What are the main issues behind the “painful” process of embedded-systems design? Shortages of resources, components, and talent plague the design process. How the instability of toolsets and driver ...