As well as being an extremely effective standalone tool for thermomicrometric sample analysis, Linkam stages are frequently used to add temperature and environmental control to a variety of ...

Spectroscopic ellipsometry is a surface sensitive, non-destructive, and non-intrusive optical metrology technique widely used to determine thin film thickness and optical constants (n, k).

One of the biggest challenges for nanoscale fabrication is how to measure devices on such a minute scale. As the semiconductor industry demands ever smaller devices, the need for reliable, robust ...