(Nanowerk Spotlight – Application Note) Most of the material properties investigated by atomic force microscopy AFM are acquired by processing the deflection signal of the cantilever as depicted in ...
Mapping the electrostatic force field of single molecules from high-resolution scanning probe images
How electronic charge is distributed over a molecule determines to a large extent its chemical properties. Here, we demonstrate how the electrostatic force field, originating from the inhomogeneous ...
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