Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...
Two-dimensional van der Waals materials have been the focus of work by numerous research groups for some time. Standing just a few atomic layers thick, these structures are produced in the laboratory ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
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