The purpose of the project is to simply identify and test the condition of digital IC if it is good or defective. An IC tester can be applied to any type of digital ICs. There are some provisions that ...
In this paper, the authors describe the implementation of testing of CMOS (Complementary Metal-Oxide-Semiconductor) digital integrated circuits for both functional and delay fault testing using ...
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Electronic enthusiasts searching for a small multifunctional USB digital tester, may be interested in a new product now available from the Adafruit online store. Supporting measurements for USB A, ...