While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

To view a PDF version of this article, click here. To maintain test quality, designers must continually update or replace their DFT techniques. While this applies across the board, DFT for ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate ...