The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

There's good news and bad news about testability in the year 2001. The good news is that changes in circuit design techniques have erased some of the original seven deadly sins of designing a circuit ...

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...

A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...

While working for Hewlett-Packard’s medical group, a manager said, “When the barriers to entry are high, those who overcome them have a strategic advantage.” That adage has remained important in the ...