If there's a truism in design debug and test, it's that the earlier you can find a bug, the less costly it is to fix. Thus, finding bugs at RTL is far preferable to finding them after synthesis. With ...
Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
Integration enables companies to prepare designs and implement robust test strategies early in the PCB assembly manufacturing process, enabling earlier defect detection, reduced costs, accelerated ...
Vijay Sontakke, who works at Intel Corporation as a design engineer, has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing. His ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results