Feb 27 (Reuters) - A former executive at Magellan Diagnostics has agreed to plead guilty to concealing from regulators that the company had discovered a malfunction in its lead-testing devices that ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

As enterprises rethink their testing strategies, many teams are reviewing AI test automation tools that can help modernize QA ...

PV module defects are increasing as manufacturers struggle to achieve consistent quality through robust bill-of-materials and process controls.

The approach toward software testing has drastically changed over the years. It has changed from manual testing to automation frameworks and now to AI-based testing. It isn’t just about increasing ...