MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...

As semiconductor chip technology advances towards nanometre and sub-nanometre scales, the demands becomes exponentially more ...

Flip chip microelectronic packaging has emerged as a cornerstone technology in modern semiconductor assembly, wherein the die is mounted upside down to the substrate to facilitate direct ...

For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...

MILPITAS, Calif., July 20, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to ...

As the final step in the production process, inspection is of critical importance to the manufacturing industry. Manufacturers generally allot adequate staff resources to perform inspection for the ...

A new technical paper titled “Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS” was published by researchers at KU Leuven, imec, Ghent University, and ...

On the 24th of last month at the inspection room of Shinhadaiamond Industry’s first factory in Namdong-gu, Incheon, 12 ...

SAN FRANCISCO — A few weeks ago when Applied Materials announced that they were getting into the brightfield defect inspection biz, many saw it as a direct challenge to rival KLA-Tencor Corp. Wafer ...

SINGAPORE – Defect inspection firms say they are experiencing a surge in demand for their services as many Housing Board projects have been completed over the past year after Covid-19 pandemic-related ...