EDN

Complex SoC Testing with a Core-Based DFT Strategy

With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically &#8212 making it almost impossible to test an entire design once it ...
Semiconductor Engineering

Shift Left In DFT Design

The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to ...
Electronic Design

DFT Strategies for SOC Designs

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
Design-Reuse

DeFacTo Unveils New Design for Test Product that Eliminates Need for Gate-level Scan; Creates Industry's First High-level DFT Sign-off Methodology

HiDFT-Scan Analyzes, Implements Scan Test Structures in Register-Transfer Level Designs; Closes Historical Gap between RTL and DFT PALO ALTO, Calif.--October 22, 2007--DeFacTo Technologies today ...
EDN

ITC: DeFacTo unveils DFT product that eliminates need for gate-level scan

DeFacTo Technologies announced at the International Test Conference a new DFT product that analyzes a register-transfer level (RTL) integrated-circuit design, creates appropriate RTL scan-test ...