Virage Logic at the International Test Conference introduced a new version of its Self Test and Repair (STAR) memory system. Originally introduced in 2001 and, according to Dr. Yervant Zorian, Virage ...
Micro Control Company at the International Test Conference exhibited its LC-1 logic burn-in with test system, which debuted at Semicon West. The LC-1 production burn-in system targets applications in ...
Abu Dhabi – The Integrated Transport Centre (ITC), an affiliate of the Department of Municipalities and Transport, participated in the 20th International Conference on Road Safety on Five Continents ...
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