TOBYHANNA ARMY DEPOT, Pa. -- A vast array of unique test fixtures at the Packaging Applications Testing Facility here gives one-of-a-kind capabilities within the Department of Defense. The facility is ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

Timely delivery of highly reliable semiconductor products to market is essential to success in today’s competitive business environment. As if following through on this objective were not already ...