The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...

When the new compactor is used for this design, the efficiency in X-state masking gets very close to the ideal compression ratio. In fact, for this case, the compression actually exceeded the ideal ...

This course will discuss the selection of member sizes for flexural, compression, and tensile member, design of bolted and weld connections for shear and axial forces; use of AISC Steel Construction ...