Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Design of power/driver ICs in compliance with latchup qualification requirements involves a conceptually different approach in comparison with digital LV (low voltage) ICs. The LV ICs’ electrostatic ...

The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...

A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...

As integrated circuit (IC) designs continue to scale, the demand for efficient power management, performance optimization and reliable physical layout modification grows more critical. Meeting these ...