ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Design of power/driver ICs in compliance with latchup qualification requirements involves a conceptually different approach in comparison with digital LV (low voltage) ICs. The LV ICs’ electrostatic ...

Leakage in IC designs constitutes a significant amount of power dissipation because CMOS gates are not ideal switches. The leakage in CMOS gates varies significantly for different combinations of ...

A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...

As integrated circuit (IC) designs continue to scale, the demand for efficient power management, performance optimization and reliable physical layout modification grows more critical. Meeting these ...